WAFER PROBER ACCESSORIES
Wentworth’s offer a complete range of prober enhancing accessories and options, complementing and expanding the capabilities of our probe stations.
LabMaster™ allows real-time, fully integrated monitoring and control via a simple-to-use windows based graphical interface. LabMaster™ controls the Pegasus™ prober via either an RS232 interface or a GPIB (IEEE488.2) interface using the National Instruments PCI-GPIB board.
GuardMaster™ provides a combined localized Light-tight and EMC shielded enclosure for low level measurements and frost-free low temperature probing. The compact ergonomic design allows the chuck chamber to be quickly purged with dry air or Nitrogen which provides a very stable environment for sensitive temperature measurements, while still providing easy access for optics, manipulators and probe cards. An extended stage Y axis provides an uninhibited wafer loading position a unique feature of our Semi-Automatic FA series probe stations.
Wentworth offer performance thermal chuck solutions for device testing from -65oC to +400oC. Wentworth’s propriety Heating and Cooling management system is an integral part of GuardMaster™, utilizing CDA or Nitrogen to reduce thermal effects and keeping the probing environment controlled.
Our Prober hardware and software solutions can be customized to your prober / tester requirements and with most configurations, upgrades are available to meet future probing requirements and to insure you have the right return on your investment.